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May 30.1983-China's first large-scale X-ray tomographic brain scanning device passed technical appraisal

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May 30, 1983 April 18 (Guihai years), China's first large-scale X-ray tomographic brain scanning device passed technical appraisal. May

1983 30, Shanghai Institute of medical devices, and other units developed China's first large-scale X-ray tomographic brain scanning device, after the clinical use of the 246 cases, proved effective in Shanghai passed technical appraisal . X-ray tomography brain scanning device is of a major scientific and technological achievements, there were only a few countries such as the United States, Japan can produce, it can effectively diagnose brain tumors, cerebral hemorrhage and cerebral embolism many brain diseases.

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